Factors to consider when analyzing data used in combination with QCM-D and ellipsometry

QCM-D and Ellipsometry are two sensitive real-time surface inspection techniques that can be combined to produce synergistic effects. However, in order to get the best combined output data as much as possible, we need to consider the similarities and differences between the two technologies. So what should you consider when setting up the data for the combined experiment and subsequent analysis?
Optimizing the analysis of QCM-D and ellipsometry combined output data <br> Our ultimate goal is to obtain information about research systems that are not available for either of these technologies. Therefore, to make full use of the combined output data, you must recognize what the information generated by each method is and how to make the most of it.
Understand the information output of QCM-D and Spectral Ellipsometry (SE) <br> To understand the synergy that this technology will produce, it is best to first understand the individual output of each technology and how to These output information are combined to produce a new information output that cannot be achieved using separate technologies.
Both QCM-D and Spectral Ellipsometry (SE) are sensitive real-time surface measurement techniques that detect surface quality changes, QCM-D detects information about “wet mass”, and ellipsometry detects “dry mass” information. . Therefore, through the combination of technology, it is not only possible to obtain information on the quality, thickness, mechanics and optical properties of the thin layer formation and modification at the solid-liquid interface, but also to monitor the microstructure and structure of the thin layer in real time. Combining the wet mass and the dry mass, information such as the porosity, conformation and swelling state of the film can be inferred.
The analysis begins with the extraction of independently measured SE and QCM-D thickness and mass; d ^SE , d ^QCM-D , m ^SE and m ^QCM-D . The degree of solvation in the film layer can then be estimated.
The volume fraction we get is:
S ⁰ _v = d ^SE / d ^QCM-D (1)
And the quality score parameters are:
S ⁰ _m = m ^SE / m ^QCM-D (2)
Optimizing the quality of the data measured by the combination of QCM-D and ellipsometry <br> Once we understand the methods and requirements for each method's high-quality data output, we can plan and execute the experiment from the perspective of combined data analysis. Optimize the quality of your data.

• Both technologies are sensitive to pollution. Therefore, the surface cleanliness of instruments and sensors is critical.
• For both methods, especially QCM-D measurements, temperature stability is very important. Care should be taken to activate instrument temperature control and to avoid large fluctuations in ambient temperature.
• From the SE perspective, SE data modeling requires SE reference measurements that provide information about the optical properties of the substrate, environmental media, adsorbate, etc., as well as information that measures other effects caused by experimental setup at each stage, as shown in Figure 1. Therefore, the following spectrum must be obtained:

Naked substrate
2. Bare substrate + window (air environment)
3. Bare substrate + window (liquid environment) (ie background environment)
4. Bare substrate + window (liquid environment), and molecules under study

• Another aspect that needs attention is the metric calibration of time. The adsorption molecular weight parameter is calculated as a function of time, so the thickness or mass parameters obtained by the ellipsometry and QCM-D methods need to be closely related to time.
• To facilitate analysis of the respective data sets and calibration of the data, it is best to obtain a baseline of at least 5 - 10 minutes.

Figure 1. Cross-sectional schematic of an ellipsometry module with a sensor and SE-value measurement collector.
Conclusion
QCM-D and ellipsometry are two complementary techniques that, when combined, produce synergistic effects and provide a deeper understanding of the system under study than either of these techniques. Knowing the output information of the respective technologies, you can obtain additional parameter information such as the adsorption score. In order to optimize data analysis, it is important to combine joint experiments with the needs of both technologies.
Download our white paper, read more about the theory behind data quantification, and get step-by-step steps on how to perform a combined analysis of QCM-D and ellipsometry.

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